229. ROZHOVORY

Poradatele :

Krystalograficka spolecnost
Regionalni komitet IUCr
Matematicko-fyzikalni fakulta UK

Cas :

ctvrtek 12.10.1995, 9.00-13.00

Misto :

Matematicko-fyzikalni fakulta Univerzity Karlovy
Praha 2, Ke Karlovu 5, poslucharna F2

Doprava :

pesky od stanice metra trasy C, I.P.Pavlova,
kolem restaurace U Kalicha

Program :

J. Zweck (University of Regensburg, Germany)

Determination of Layer Structure and Quality of Multilayer Systems (TEM, XRD)

J. Bradler (Fyzikalni ustav AV CR)

Zarizeni pro rtg analyzu povrchu (reflektivita, fluorescence)

V. Honkimaki (University of Helsinki, Finland, ESRF Grenoble) :

Effects of Instrumental Function, Crystallite Size and Strain on Reflection Profiles ( a new approach to profile analysis)

D. Rafaja

Zkusenosti s metodami dekonvoluce difrakcnich profilu